A new time and position sensitive particle detection system based on fast frame CMOS (complementary metal oxide semiconductors) cameras is developed for coincidence ion/electron imaging. The detector is used with a conventional multichannel plates (MCP)/phosphor screen ion/electron imager. It collects the positional information of ions/electron from a fast frame camera through real-time centroiding. The arrival times of ions are obtained from the timing signal of a single anode photomultiplier tube (PMT), while the timings of electrons are picked up from MCP by connecting a signal decoupler to the grounded MCP front plate. Both signals are processed by a high-speed digitizer. Multi-hit capability is achieved by correlating the intensity of ion/electron spots on each camera frame with the peak heights on the corresponding time-of-flight spectrum from a digitizer.