Jasco V-570 UV-Vis-NIR Spectrophotometer with INS-470 Integrating Sphere Attachment
- Obtain the absorption, percent transmittance, or percent reflectance spectrum of a solution in the range 190-2500 nm.
- Dual-beam for beam intensity fluctuations.
- The integrating sphere attachment is designed to measure the transmittance and reflectance of a sample that diffuses light rather than absorbs light. Can be used for solids or dispersed particles in solution. With the integrating sphere attachment, can scan from 220 nm-2,000 nm.
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Jasco FP-6500 Spectrofluorometer
- Collects emission or excitation spectrum in the range 200 to 850 nm.
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Varian Scimitar FT-IR
- Mid-IR detectors, beam splitters, and filters.
- ATR module and salt plate holders available.
- Qualitative analysis of functional groups only.
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Perkin Elmer Polarimeter
- 100 mm cell paths available.
- Na or Hg lamps with adjustable aperture.
- Find specific rotation of chiral molecules or enantiomeric excess if specific rotation is known.
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Shimadzu Energy Dispersive X-Ray Fluorescence Spectrometer
- The energy dispersive x-ray fluorescence (XRF) spectrometer is a non-destructive analytical technique to determine elemental composition.
- Bulk solids, powders, films, and liquid samples can be used. For metals of any form 100 µm of thickness is needed. For plastics, 3 mm
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Perkin-Elmer AAnalyst 700 Atomic Absorption Spectrometer
- Atomic absorption spectrometer for elemental analysis. Several hallow cathodes provided for detection of over 30 elements.
- Automated motorized atomizer exchange to switch between flame and graphite furnace.
- Autosampler for graphite furnace.
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